Thermally driven reliability issues in microelectronic systems: status-quo and challenges

Author:

Lasance Clemens J.M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Enhanced electronic system reliability––challenges for temperature prediction;Parry;IEEE CPT,2002

2. Bailey C. Modelling the effect of temperature on product reliability. In: Proceedings of SEMI-THERM XIX, 2003. p. 324–31

3. Luiten W. Sense and nonsense thermal requirements. In: Proceedings of SEMI-THERM XIX, 2003. p. 332–5

4. The conceivable accuracy of experimental and numerical thermal analyses of electronic systems;Lasance;IEEE CPT,2002

5. Zhang GQ, Tay A, Ernst LJ. Virtual thermo-mechanical prototyping of electronic packaging––bottlenecks and solutions of damaging modelling. In: Proceedings of 3rd Electronic Packaging Technology Conference (EPTC), Singapore, 2000. p. 263–70

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