Author:
Raghavachari M.,Srinivasan Aparna,Sullo Pasquale
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Cost-size optima of monolithic integrated circuits;Murphy,1964
2. On Murphy's yield integral;Stapper;IEEE Trans. Semiconductor Mfg,1991
3. Defect density distribution for LSI yield calculations;Stapper;IEEE Trans Electron Devices,1973
4. Mathematical Analysis;Apostol,1986
5. On yield, fault distributions, and clustering of particles;Stapper;IBM J. Res. Dev.,1986
Cited by
31 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献