Challenges for giga-scale integration-Reference-Cited by-同舟云学术

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Challenges for giga-scale integration

Published:1997-07 Issue:7 Volume:37 Page:985-1001
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Takeda Eiji

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. An experimental 220-MHz 1 Gb DRAM;Horiguchi;IEEE ISSCC,1995

2. Trends in single-wafer processing;Doering,1992

3. Symposium on VLSI Circuits;Kushiyama,1992

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