Multi-release software model based on testing coverage incorporating random effect (SDE)-Reference-Cited by-同舟云学术

Multi-release software model based on testing coverage incorporating random effect (SDE)

Published:2023 Issue: Volume:10 Page:102076
ISSN:2215-0161
Container-title:MethodsX
language:en
Short-container-title:MethodsX

Author:

Bibyan Ritu,Anand Sameer^ORCID,Aggarwal Anu G.,Kaur Gurjeet

Publisher

Elsevier BV

Subject

Medical Laboratory Technology,Clinical Biochemistry

Reference45 articles.

1. Multi-release software reliability growth assessment: an approach incorporating fault reduction factor and imperfect debugging;Aggarwal;Int. J. Math. Oper. Res.,2019

2. Multi-objective Release Time Problem for Modular Software using Fuzzy Analytical Hierarchy Process;Aggarwal,2022

3. Cai, X., & Lyu, M.R. (2007). Software reliability modeling with test coverage: experimentation and measurement with a fault-tolerant software project. Paper presented at the The 18th IEEE International Symposium on Software Reliability (ISSRE'07).

4. A testing-coverage software reliability model with the uncertainty of operating environments;Chang;International Journal of Systems Science: Operations & Logistics,2014

5. Effect of Test Coverage and Change Point on Software Reliability Growth Based on Time Variable Fault Detection Probability;Chatterjee;J. Softw.,2016

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Software Testing Framework for the Financial Market;American Journal of Software Engineering and Applications;2024-06-19

2. Modeling the impact of noise and uncertain operational environment on software release decisions considering testing coverage-based SRGM;Intelligent Decision Technologies;2024-06-19

3. Software Technology Management Under Stochastic Environment;Risk, Reliability and Safety Engineering;2024

4. Reliability Perspective of Software Models: An Overview;Springer Series in Reliability Engineering;2024

5. METCN: A Multi-Task Enhanced TCN Model for Software Fault Detection and Correction Prediction;2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C);2023-10-22