Thickness-dependence of stoichiometry and microstructure characteristics in correlation with conductivity type of CdTe films-Reference-Cited by-同舟云学术

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Thickness-dependence of stoichiometry and microstructure characteristics in correlation with conductivity type of CdTe films

Published:2003-01 Issue:2 Volume:423 Page:146-152
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Ramadan A.A,Abd-El Mongy A,Ahmed Farag I.S,El-Shabiny A.M,Radwan F.A,Ismail H.I,Hashem H.M

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Preparation and characterization of CdTe thin films deposited by CSS

2. Point defects in Cl and Na doped CdTe monograin powders

3. Low Resistivity CdTe ‐ Te Films by a Combined Hot‐Wall‐Flash Evaporation Technique

4. Properties of CdTe‐Te alloy films prepared using molecular beams

5. A Very-High-Conductivity of In-Doped CdTe Film

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1. Investigation of the influences of heat treatment on the microstructures and thermal properties of Al-20Si alloy fabricated by powder extrusion;Materials Characterization;2020-10

2. Structure and corrosion behavior of sputter deposited cerium oxide based coatings with various thickness on Al 2024-T3 alloy substrates;Applied Surface Science;2015-11

3. Influence of post-deposition heat treatment on optical properties derived from UV–vis of cadmium telluride (CdTe) thin films deposited on amorphous substrate;Applied Surface Science;2015-07

4. Physical properties of electron beam evaporated CdTe and CdTe:Cu thin films;Journal of Applied Physics;2014-12-07

5. Low-temperature photoluminescence of II–VI films obtained by close-spaced vacuum sublimation;Journal of Luminescence;2012-11

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