Between nanoindentation and scanning force microscopy: measuring mechanical properties in the nanometer regime-Reference-Cited by-同舟云学术

Between nanoindentation and scanning force microscopy: measuring mechanical properties in the nanometer regime

Published:1997-10 Issue: Volume:308-309 Page:289-296
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Baker Shefford P

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Z. Jiang, C.-J. Lu, D.B. Bogy, C.S. Bhatia and T. Miyamoto, Thin Solid Films, 258 (1995) 75.

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3. B. Bhushan, in B. Bhushan (ed.), Handbook of Micro/Nanotribology, CRC Press, Boca Raton, FL, 1995, p. 321.

4. W.C. Oliver and G.M. Pharr, J. Mater. Res., 7 (1992) 1564.

5. S.P. Baker, in P.H. Townsend, C.-Y. Li, J.E. Sanchez and T.P. Weihs (eds.), Thin Films: Stresses and Mechanical Properties IV, Vol. 308, Proc. Materials Research Society, Pittsburgh, PA, 1993, p. 209.

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