Spectroscopic ellipsometry studies of tetrahedral amorphous carbon prepared by filtered cathodic vacuum arc technique-Reference-Cited by-同舟云学术

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Spectroscopic ellipsometry studies of tetrahedral amorphous carbon prepared by filtered cathodic vacuum arc technique

Published:1998-01 Issue:1-2 Volume:312 Page:160-169
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Xu Shi,Cheah L.K.,Tay B.K.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. Compressive-stress-induced formation of thin-film tetrahedral amorphous carbon

2. Properties of filtered-ion-beam-deposited diamondlike carbon as a function of ion energy

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