Roughness analysis of optical films and substrates by atomic force microscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference27 articles.
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3. Light scattering from multilayer optics. I. Tools of investigation. II. Application to experiment;Amra;J. Opt. Soc. Am. A,1994
4. Relation between light scattering and the microstructure of optical thin films;Duparré;Appl. Opt.,1993
5. Scattering from multilayer thin films: theory and experiment;Bousquet;J. Opt. Soc. Am.,1981
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