An integrated optical method for measuring the thickness and refractive indexof birefringent thin films-Reference-Cited by-同舟云学术

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An integrated optical method for measuring the thickness and refractive indexof birefringent thin films

Published:1997-01 Issue:1-2 Volume:292 Page:255-259
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Caliendo C.,Verona E.,Saggio G.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Adam Hilger Series on Optics and Optoelectronics;Ward,1988

2. Optical constants of absorbing materials by transmission interferometry on medium-thickness films

3. Transmission method for determining the optical constants of metals

4. Multiple-Angle-of-Incidence Ellipsometry of Very Thin Films*

5. Effect of a Thin Surface Film on the Ellipsometric Determination of Optical Constants*

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