Surface investigations of nanostructured porous silicon-Reference-Cited by-同舟云学术

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Surface investigations of nanostructured porous silicon

Published:1998-04 Issue:1-2 Volume:318 Page:113-116
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Galiy P.V,Lesiv T.I,Monastyrskii L.S,Nenchuk T.M,Olenych I.B

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. Porous silicon formation: A quantum wire effect

2. M. Born, E. Wolf, Principles of Optics, Pergamon, Oxford, 1968.

3. L.E. Davis, N.C. MacDonald, P.W. Palmberg, G.E. Riach, R.E. Weber, Handbook of Auger Electron Spectroscopy, Phys. Elect. Divis., Perkin-Elmer, MN, 1978.

Cited by 23 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Photoluminescence polarization and refractive index anisotropy of porous silicon nanocrystals arrays;Applied Nanoscience;2019-06-18

2. Photoluminescence, morphological and electrical properties of porous silicon formulated with different HNO3 concentrations;Results in Physics;2018-09

3. Photoluminescent properties of nc-Si/SiOx nanosystems;Applied Nanoscience;2018-02-27

4. Effects of Irradiation on Porous Silicon;Handbook of Porous Silicon;2018

5. Chemical Characterization of Porous Silicon;Handbook of Porous Silicon;2018

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