Interface study of CuInSe2/ZnO and Cu(In,Ga)Se2/ZnO devices using ALD ZnO buffer layers-Reference-Cited by-同舟云学术

Interface study of CuInSe2/ZnO and Cu(In,Ga)Se2/ZnO devices using ALD ZnO buffer layers

Published:2003-05 Issue: Volume:431-432 Page:321-325
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Platzer-Björkman C.,Lu J.,Kessler J.,Stolt L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. J. Kessler, M. Ruckh, D. Hariskos, U. Ruhle, R. Menner, H.W. Schock, Proceedings of the 23rd IEEE Photovoltaics Specialists Conference, Louisville, 1993, p. 447

2. L.C. Olsen, W. Lei, F.W. Addis, W.N. Shafarman, M.A. Contreras, K. Ramanathan, Proceedings of the 26th IEEE Photovoltaics Specialists Conference, Anaheim, 1997, p. 363

3. J. Sterner, J. Kessler, M. Bodegård, L. Stolt, Proceedings of the Second World Conference Photovoltaic Energy Conversion, Vienna, 1998, p. 1145

4. Cadmium-free buffer layers deposited by atomic later epitaxy for copper indium diselenide solar cells

5. Improvement in Performances of ZnO:B/i-ZnO/Cu(InGa)Se2Solar Cells by Surface Treatments for Cu(InGa)Se2

Cited by 69 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Numerical Simulation Approach for an Investigation of Critical Parameters of ZTO Buffer Layer for CZTS Photovoltaic Cell Performance: A One-Dimensional Modeling;Journal of Electronic Materials;2024-07-03

2. Electrochemical deposition of Cr3+ doped CuInSe2 thin films for electrocatalytic activity and photovoltaic performance;Electrochimica Acta;2024-02

3. Design of advanced energy-related materials via atomic layer deposition;Chinese Science Bulletin;2023-07-01

4. Performance enhancement of CIGS solar cells using ITO as buffer layer;Micro and Nanostructures;2022-08

5. Real-Time In Situ Parallel Detection of Elements and Molecules with TOFMS during ALD for Chemical Quality Control of Thin Films;The Journal of Physical Chemistry C;2022-01-25