Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Cited by
4 articles.
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1. The Impact of Well-Edge Proximity Effect on PMOS Threshold Voltage in Various Submicron CMOS Technologies;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03
2. EPR study of defects produced by MeV Ag ion implantation into silicon;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-05
3. Lateral ion implant straggle and mask proximity effect;IEEE Transactions on Electron Devices;2003-09
4. Defects in annealed 1.5 MeV boron implanted p-type silicon;Journal of Electronic Materials;2001-07