Reflection properties of oriented thin CdS films formed by laser ablation-Reference-Cited by-同舟云学术

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Reflection properties of oriented thin CdS films formed by laser ablation

Published:2000-02 Issue:1-2 Volume:360 Page:222-228
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Dushkina N.M,Ullrich B,Sakai H,Segawa Y,Hibino K,Eiju T

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Chapter 26;Nishihara,1994

2. Advanced Microsystems for Automotive Applications;Böhm,1998

3. Integrated optics and new wave phenomena in optical waveguides

4. Growth of highly oriented CdS thin films by laser‐evaporation deposition

5. The effect of the substrate on the emission features of thin CdS films formed by laser ablation

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3. Resonant Raman scattering in nanocrystalline thin CdS film;Journal of Raman Spectroscopy;2016-07-29

4. Determination of the photoinduced birefringence and of the refractive index by Brewster method of epoxy resin doped with CdS;Optical Materials;2012-09

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