Charging and discharging of defect states in CIGS/ZnO junctions-Reference-Cited by-同舟云学术

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Charging and discharging of defect states in CIGS/ZnO junctions

Published:2000-02 Issue: Volume:361-362 Page:140-144
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Delahoy A.E.,Ruppert A.,Contreras M.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Proc. 2nd World Conf. Photovoltaic Sol. Energy Conv., EC, Ispra;Delahoy,1998

2. Proc. 26th IEEE Photovoltaic Spec. Conf.;Meyer,1997

3. Proc. 2nd World Conf. Photovoltaic Sol. Energy Conv., EC, Ispra;Meyer,1998

4. Proc. 2nd World Conf. Photovoltaic Sol. Energy Conv., EC, Ispra;Kronik,1998

5. NCPV Photovoltaics Program Review;Rockett,1999

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