Applications of optically detected magnetic resonance in semiconductor layered structures
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Structural Analysis of Point Defects in Solids;Spaeth,1992
2. Principles of Magnetic Resonance, Springer series in Solid State Sci. Vol. 1;Slichter,1990
3. Electron Paramagnetic Resonance of Transition Ions;Abragam,1970
4. Optically detected magnetic resonance (O.D.M.R.) investigations of recombination processes in semiconductors
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