Author:
Moritani A,Yamada T,Kitamura T,Katayama H,Noda Y,Kanayama N
Subject
Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials
Reference6 articles.
1. Diamond epitaxy on (001) silicon: An interface investigation
2. In‐process ellipsometric monitoring of diamond film growth by microwave plasma enhanced chemical vapor deposition
3. A. Moritani, K. Kitahara, T. Kitamura, H. Katayama, N. Kanayama, M. Suzuki, Abstract 12th Symposium on Plasma Science for Materials, Tokyo, 1999 p. 16.
4. Proceedings of the 2nd International Conference on Spectroscopic Ellipsometry, edited by R.W. Collins, D.E. Aspnes, E.A. Irene, Thin Solid Films, 1998 Vol. 313–314.
5. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
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