Enhanced optical performance of aluminum films by copper inclusion-Reference-Cited by-同舟云学术

Enhanced optical performance of aluminum films by copper inclusion

Published:1999-07 Issue:1-2 Volume:348 Page:222-226
ISSN:0040-6090
Container-title:Thin Solid Films
language:en
Short-container-title:Thin Solid Films

Author:

Kylner C.,Mattsson L.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Optical Film Materials and Their Applications

2. Standard test method for measuring the effective surface roughness of optical components by total integrated scattering, American Society for Testing and Materials, Standard F 1048-87, 1987.

3. Real-time study of migration in aluminum films by means of subÅngström-sensitive scattering and profiling methods

4. Simultaneous real-time study of initial hillocking and changes in overall stress in evaporated Al films during heating

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