Contours of constant Δ and Ψ in the ε2–ε4 plane for the ellipsometric functions
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. The geometric forms of the equations for reflectance and transmittance for radiation incident on very thin films
2. Geometric form of the equations for the phase changes on reflection and transmission at a thin absorbing film
3. Further observations on the variation with dielectric constant and thickness of the reflectance and phase change on reflection of films
4. Behaviour of transmittance and phase change on transmission with film thickness at intermediate thicknesses
5. Azzam RMA, Bashara NM. Ellipsometry and polarised light. Amsterdam: North-Holland, 1977 [chapter 3].
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