Tracing of interference fringes using average gray value and simultaneous row and column scan-Reference-Cited by-同舟云学术

Tracing of interference fringes using average gray value and simultaneous row and column scan

Published:2003-03 Issue:2 Volume:35 Page:73-79
ISSN:0030-3992
Container-title:Optics & Laser Technology
language:en
Short-container-title:Optics & Laser Technology

Author:

Anand Arun

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference8 articles.

1. Malacara D, DeVore SL. Optical shop testing. New York: Wiley, 1992. p. 455–99.

2. Platt BC, Reynolds SG, Holt TR. Optical interferograms-reduction and interpretation. ASTM Symposium, American Society for Testing and Materials Technology Publication, 1978. p. 666.

3. Real-time fringe processing by hybrid analog-digital system;Tooyooka;Proc SPIE,1987

4. Algorithm for computer tracing of interference fringes;Krishnaswamy;Appl Opt,1991

5. Interactive fringe processing algorithm for interferogram analysis;Parthiban;Opt Lasers Eng,1989

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