Fourier transform moiré tomography for high-sensitivity mapping asymmetric 3-D temperature field
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference14 articles.
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2. Refractive index measurements by moiré deflectometry;Kafri;Appl Opt,1982
3. Measurements of phase objects using the Talbot effect and moiré techniques;Nakano;Appl Opt,1984
4. Noncoherent methods for mapping phase objects;Kafri;Opt Lett,1980
5. Computer moiré deflectometry using the Talbot effect;Vlad;Opt Eng,1991
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