Quantitative secondary ion mass spectrometry depth profiling of surface layers of cubic silver halide microcrystals
Author:
Affiliation:
1. Department of Chemistry, University of Antwerp, Universiteitsplein 1, B-2610, Antwerp, Belgium
2. Agfa-Gevaert N. V., Mortsel, Belgium
Publisher
American Chemical Society (ACS)
Subject
Spectroscopy,Structural Biology
Link
https://pubs.acs.org/doi/pdf/10.1016/S1044-0305%2899%2900064-1
Reference38 articles.
1. The silver halide photographic process
2. Oxygen enhanced secondary ion emission of Fe and Co by TOF-SIMS and ISS/DR
3. Ultra shallow doping profiling with SIMS
4. Determination of the surface predominance of toxic elements in airborne particles by ion microprobe mass spectrometry and Auger electron spectrometry
5. Microcharacterization of trace elemental distributions within individual coal combustion particles using secondary ion mass spectrometry and digital imaging
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2. Chemical Microcharacterization of Ultrathin Iodide Conversion Layers and Adsorbed Thiocyanate Surface Layers on Silver Halide Microcrystals with Time-of-Flight SIMS;Microscopy and Microanalysis;2002-06
3. Modeling of the sputtering process of cubic silver halide microcrystals and its relevance in depth profiling by secondary-ion mass spectrometry (SIMS);Fresenius' Journal of Analytical Chemistry;2001-07-01
4. Atomic mass spectrometry;Journal of Analytical Atomic Spectrometry;2000
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