Quantitative evaluation of SIMS-spectra using Saha-Eggert type equations
Author:
Publisher
Elsevier BV
Subject
Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation
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3. Quantitative static secondary ion mass spectrometry of molecular ions from 1-.beta.-3,4-dihydroxyphenylalanine (L-dopa) and indolic derivatives;Analytical Chemistry;1990-04-01
4. Redistribution of boron during thermal oxidation of silicon studied by SIMS using Ar+ bombardment and the MISR method. Part I: Methodology;Surface and Interface Analysis;1989-04
5. Improvement in quantitative correction in SIMS using Saha-Eggert equation;Mikrochimica Acta;1985-01
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