Author:
Ryoo Gyeongbeom,Shin Jiwon,Guk Kim Byeong,Geun Lee Do,Tark Han Joong,Park Byeongho,Oh Youngseok,Yol Jeong Seung,Lee Se-Hee,Yun Lee Dong,Kim Daeho,Hwan Park Jong
Funder
National Research Council of Science and Technology
Korea Institute of Materials Science
Korea Electrotechnology Research Institute