1. Variable sampling plans for normal distribution indexed by Taguchi's loss function;Arizono;Naval Research Logistics (NRL),1997
2. A new multiple dependent state sampling plan based on the process capability index;Aslam;Published online in Communications in Statistics-Simulation and Computation,2019
3. Multiple dependent state variable sampling plans with process loss consideration;Aslam;The International Journal of Advanced Manufacturing Technology,2014
4. Multiple dependent state sampling plans for lot acceptance based on measurement data;Balamurali;European Journal of Operational Research,2007
5. Bates, S. P. (2000). Silicon wafer processing. Industry initiatives for science and math education (IISME), San Jose, CA.