A new EDA algorithm combined with Q-learning for semiconductor final testing scheduling problem-Reference-Cited by-同舟云学术

A new EDA algorithm combined with Q-learning for semiconductor final testing scheduling problem

Published:2024-07 Issue: Volume:193 Page:110259
ISSN:0360-8352
Container-title:Computers & Industrial Engineering
language:en
Short-container-title:Computers & Industrial Engineering

Author:

Zhang Long^ORCID,Lin Yi,Xu Chuanpei,Liu Min

Funder

Guangxi Key Laboratory of Automatic Detection Technology and Instrument

Natural Science Foundation of Guangxi Province

Guangxi Key Laboratory of Automatic Detection Technology and Instrument Foundation

National Natural Science Foundation of China

Publisher

Elsevier BV

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