Single crystal diffraction studies of stacking faults in close-packed structures-Reference-Cited by-同舟云学术

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Single crystal diffraction studies of stacking faults in close-packed structures

Published:1987-01 Issue: Volume:14 Page:103-183
ISSN:0146-3535
Container-title:Progress in Crystal Growth and Characterization
language:en
Short-container-title:Progress in Crystal Growth and Characterization

Author:

Sebastian M.T.,Krishna P.

Publisher

Elsevier BV

Subject

General Engineering

Reference148 articles.

1. X-ray Diffraction;Warren,1969

2. X-ray Optics;Wilson,1962

3. Recent Developments in Metallurgical Science and Technology;Anantharamen,1972

4. Polymorphiem and Polytypism in Crystals;Verma,1966

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2. New insights in structural characterization of transparent ZnS ceramics hot-pressed from nanocrystalline powders synthesized by combustion method;Journal of the European Ceramic Society;2019-08

3. On Possible States of the Crystal Structure Preceding to a Phase Transition in Zn1 – xVxSe (0.01 ≤ x ≤ 0.10) Crystals;Physics of the Solid State;2018-12

4. Variability of the resulting microdeformation field in the Zn1 – xV x Se crystals (0.01 ≤ x ≤ 0.10);Physics of the Solid State;2018-01

5. Characterization of Crystals;Introduction to Crystal Growth and Characterization;2014-08-01

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