Analyses of residual stresses on stamped valves by X-ray diffraction and finite elements method-Reference-Cited by-同舟云学术

Analyses of residual stresses on stamped valves by X-ray diffraction and finite elements method

Published:2006-10 Issue:1-3 Volume:179 Page:30-35
ISSN:0924-0136
Container-title:Journal of Materials Processing Technology
language:en
Short-container-title:Journal of Materials Processing Technology

Author:

Martins Jairo Aparecido,Cardoso Lisandro Pavio,Fraymann José Alfredo,Button Sérgio Tonini

Publisher

Elsevier BV

Subject

Industrial and Manufacturing Engineering,Metals and Alloys,Computer Science Applications,Modeling and Simulation,Ceramics and Composites

Reference9 articles.

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4. Elements of X-ray diffraction;Cullity,1978

5. J. Scarminio, Propriedades mecânicas em filmes de Nb/Pd, Tese (doutorado), Instituto de Física Gleib-Wataglin, Universidade Estadual de Campinas, UNICAMP, 1989.

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