Error compensation for CMM touch trigger probes-Reference-Cited by-同舟云学术

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Error compensation for CMM touch trigger probes

Published:1996-10 Issue:2-3 Volume:19 Page:85-97
ISSN:0141-6359
Container-title:Precision Engineering
language:en
Short-container-title:Precision Engineering

Author:

Estler W.Tyler,Phillips S.D.,Borchardt B.,Hopp T.,Witzgall C.,Levenson M.,Eberhardt K.,McClain M.,Shen Y.,Zhang X.

Publisher

Elsevier BV

Subject

General Engineering

Reference11 articles.

1. Probe for use in measuring apparatus;McMurtry;U.S. Patent 4,138,823,1979

2. An investigation into the performance of probes on coordinate measuring machines;Butler;Ind Metrology,1991

3. Performance characteristics of touch trigger probes;Jarman,1990

4. Probe technology—Beyond accuracy;Reid,1993

5. Performance evaluations;Phillips,1995

Cited by 54 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A state-of-the-art review on the research and application of on-machine measurement with a touch-trigger probe;Measurement;2024-01

2. A Novel Pretravel Error Compensation Strategy for Five-Axis On-Machine Measurement With a Touch-Trigger Probe;IEEE Transactions on Instrumentation and Measurement;2023

3. Feasibility Study of a Piezo Actuator as a Potential Standard in Calibration for Roundness Instruments;Sensors;2022-11-29

4. A new stylus orientation planning strategy for sculpture surface inspection based on touch position graph;Measurement;2022-08

5. Dynamics model of scanning probe on GMC;Measurement;2022-08

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