Complementary vibrational and reflectance anisotropy spectroscopic determination of molecular azimuthal orientation-Reference-Cited by-同舟云学术

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Complementary vibrational and reflectance anisotropy spectroscopic determination of molecular azimuthal orientation

Published:1999-06 Issue: Volume:427-428 Page:446-451
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Perry C.C.,Frederick B.G.,Power J.R.,Cole R.J.,Haq S.,Chen Q.,Richardson N.V.,Weightman P.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference25 articles.

1. Application of reflectance difference spectroscopy to molecular‐beam epitaxy growth of GaAs and AlAs

2. Reflectance-difference spectroscopy: a new probe of crystal growth by MBE and OMCVD

3. Anisotropic reflectance from semiconductor surfaces for in-situ monitoring in epitaxial growth systems

4. New developments in spectroellipsometry: the challenge of surfaces

5. In situ monitoring of crystal growth by reflectance difference spectroscopy

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1. Effects of steps and ordered defects on Cu(110) surface states;Physical Review B;2013-06-04

2. In-situ, Real-Time Investigation of Organic Thin Film Growth Using Reflectance Difference Spectroscopy;Small Organic Molecules on Surfaces;2013

3. Effect of surface defects and adsorbates on the optical anisotropy of Cu(110);Physical Review B;2010-08-18

4. Synthesis and structure of dimeric anthracene-9-carboxylato bridged dinuclear erbium(III) complex, [Er2(9-AC)6(DMF)2(H2O)2];Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy;2009-05

5. Optical differential reflectance spectroscopy of ultrathin epitaxial organic films;Physical Chemistry Chemical Physics;2009

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