Determination of growth modes of Cu on O/Ni() and NiO() surfaces by SIMS and secondary electron emission measurements
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference39 articles.
1. A model for the Auger electron spectroscopy of systems exhibiting layer growth, and its application to the deposition of silver on nickel
2. Adsorbed layer and thin film growth modes monitored by Auger electron spectroscopy
3. On the growth of Ni on Cu(100)
4. Structural study of the epitaxial growth of fcc-Fe films, sandwiches, and superlattices on Cu(100)
5. STM study of preferential growth of one-dimensional nickel islands on a Cu(100)-(2)R45°-O surface
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