Quantitative investigation of amorphous Fe/Ge and Fe/Si by inelastic peak shape analysis
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference17 articles.
1. Influence of elastic and inelastic scattering on energy spectra of electrons emitted from solids
2. Formalism for quantitative surface analysis by electron spectroscopy
3. Surface nanostructure determination by x‐ray photoemission spectroscopy peak shape analysis
4. Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape
5. Inelastic peak shape method applied to quantitative surface analysis of inhomogeneous samples
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