Microscopic mechanism for SiO2/Si interface passivation: Si=O double bond formation
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference27 articles.
1. The Si/SiO2 interface examined by cross‐sectional transmission electron microscopy
2. The Physics of SiO2 and Its Interfaces;Bauer,1978
3. Atomic structure at the (111) Si‐SiO2interface
4. Si→SiO2transformation: Interfacial structure and mechanism
5. The Physics of SiO2 and Its Interfaces;Herman,1978
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