A theoretical study on mass sensitive surface analysis and subsurface imaging with dynamic force microscopy
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference31 articles.
1. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
3. Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
4. Atomically Resolved InP(110) Surface Observed with Noncontact Ultrahigh Vacuum Atomic Force Microscope
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2. Theoretical Simulation of Scanning Probe Microscopy;Analytical Sciences;2011
3. Investigation of the atomic-scale hysteresis in NC-AFM using atomistic dynamics;Physica E: Low-dimensional Systems and Nanostructures;2010-06
4. Energy Dissipation Mechanism of Non-Contact Atomic Force Microscopy for Movable Objects;e-Journal of Surface Science and Nanotechnology;2008
5. Mechanisms of atomic scale dissipation at close approach in dynamic atomic force microscopy;Fundamentals of Friction and Wear;2007
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