Determination of domain size distributions from LEED beam profiles: an optimization scheme based on the maximum entropy method-Reference-Cited by-同舟云学术

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Determination of domain size distributions from LEED beam profiles: an optimization scheme based on the maximum entropy method

Published:2001-09 Issue:1-2 Volume:490 Page:175-195
ISSN:0039-6028
Container-title:Surface Science
language:en
Short-container-title:Surface Science

Author:

Gierer M.,Iglesias A.,Moritz W.

Publisher

Elsevier BV

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics

Reference36 articles.

1. CAPABILITIES OF LEED FOR DEFECT ANALYSIS

2. Critical Cluster Size: Island Morphology and Size Distribution in Submonolayer Epitaxial Growth

3. Exact island-size distributions for submonolayer deposition: Influence of correlations between island size and separation

4. Growth and coalescence in submonolayer homoepitaxy on Cu(100) studied with high-resolution low-energy electron diffraction

5. E.D. Williams, Surf. Sci. 299/300 (1994) 502 and references therein

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 5.8.11 Gd, Ge;Physics of Solid Surfaces;2015

2. 5.4 SPA-LEED;Physics of Solid Surfaces;2015

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