Rapid design space exploration using legacy design data and technology scaling trend

Author:

Thangaraj Charles,Alkan Cengiz,Chen Tom

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference45 articles.

1. Justin E. Harlow III, Toward design technology in 2020: trends issues and challenges [VLSI design], in: Proceedings of IEEE Computer Society Annual Symposium on VLSI, February 2003, pp. 3–4.

2. 〈http://www.itrs.net〉, ITRS, 2005.

3. Trends and challenges in VLSI circuit reliability;Constantinescu;IEEE Micro.,2003

4. S. Rusu, M. Sachdev, C. Svensson, B. Nauta, T3: trends and challenges in VLSI technology scaling towards 100nm, in: Proceedings of ASP-DAC, IEEE Computer Society, 2002, p. 16.

5. W. Ye, et al., The design and use of simple power: a cycle-accurate energy estimation tool, in: 37th DAC, 2000, pp. 340–345.

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