Author:
Ain Antara,Mukherjee Subhankar,Dasgupta Pallab,Mukhopadhyay Siddhartha
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference24 articles.
1. G. Bonfini, M. Chiavacci, R. Mariani, E. Pescari, A Mixed-Signal Verification Kit for Verification of Analogue-Digital Circuits, 2006, pp. 88–93.
2. Chassis: a platform for verifying PMU integration using auto-generated behavioral models;Ain;ACM Transactions on Design Automation of Electronic Systems (TODAES),2011
3. Digital Systems Testing and Testable Designs;Abramovici,1994
4. G.V. Rootselaar, B. Vermeulen, Silicon debug: scan chains alone are not enough, in: Proceedings of International Test Conference, 1999, pp. 892–902.
5. P. Song, F. Stellari, T. Xia, A. Weger, A novel scan chain diagnostics technique based on light emission from leakage current, in: Proceedings of International Test Conference, 2004, pp. 140–147.