VLSI mask optimization: From shallow to deep learning-Reference-Cited by-同舟云学术

VLSI mask optimization: From shallow to deep learning

Author:

Yang Haoyu^ORCID,Zhong Wei,Ma Yuzhe,Geng Hao,Chen Ran,Chen Wanli,Yu Bei

Funder

Research Grants Council, University Grants Committee

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference38 articles.

1. Design for manufacturing with emerging nanolithography;Pan;IEEE TCAD,2013

3. Layout hotspot detection with feature tensor generation and deep biased learning;Yang;IEEE TCAD,2019

4. Detecting multi-layer layout hotspots with adaptive squish patterns;Yang,2019

5. LithoROC: lithography hotspot detection with explicit ROC optimization;Ye,2019

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