Semi-empirical RF MOST model for CMOS 65 nm technologies: Theory, extraction method and validation-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Semi-empirical RF MOST model for CMOS 65 nm technologies: Theory, extraction method and validation

Published:2016-01 Issue: Volume:52 Page:228-236
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Fiorelli Rafaella,Peralías Eduardo^ORCID

Funder

Spanish Government

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference23 articles.

1. An MOS transistor model for analog circuit design;Cunha;IEEE J. Solid-State Circuits,1998

2. Operation and Modelling of the MOS Transistor;Tsividis,2000

3. BSIM Research Group, BSIM3v3 and BSIM4 MOS Model, 2008. www-device.eecs.berkeley.edu/~bsim3/bsim4.html.

4. PSP;Gildenblat;IEEE Electron Device Lett.,2006

5. Unified complete mosfet model for analysis of digital and analog circuits;Miura-Mattausch;IEEE Trans. Circuits Syst. I,1996

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. CMOS Front End for Interfacing Spin-Hall Nano-Oscillators for Neuromorphic Computing in the GHz Range;Electronics;2023-01-03

2. Normalized Nonlinear Semiempirical MOST Model Used in Monolithic RF Class A-to-C PAs;Circuits, Systems, and Signal Processing;2019-11-07

3. Design of active inductor-based current-controlled oscillators using gm/Id methodology;AEU - International Journal of Electronics and Communications;2018-04

4. Analysis and design of moderate inversion based low power low‐noise amplifier;IET Computers & Digital Techniques;2016-09

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP