A 0.004% resolution & SAT<1.8 μson-chip adaptive anti-aging system using cuckoo intelligence-based algorithm in 65 nm CMOS

Author:

Zhang Yuejun,Zhang Haiming,Wang Pengjun,Wu Qiufeng,Li GangORCID

Funder

Fudan University

State Key Laboratory of Acoustics

Natural Science Foundation of Zhejiang Province

China Postdoctoral Science Foundation

Ningbo University

National Natural Science Foundation of China

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference27 articles.

1. The impact of self-heating on HCI reliability in high-performance digital circuits;Jiang;IEEE Electron. Device Lett.,2017

2. Estimating circuit aging due to BTI and HCI using ring-oscillator-based sensors;Sengupta;IEEE Trans. Comput. Aided Des. Integrated Circ. Syst.,2017

3. New insights on device level TDDB at GHz speed in advanced CMOS nodes;Arabi;IEEE Trans. Device Mater. Reliab.,2019

4. Mcpens: multiple-critical-path embeddable nbti sensors for dynamic wearout management;Guo,2015

5. Fine grained wearout sensing using metastability resolution time;Suresh,2014

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