Author:
Krištofík Štefan,Malík Peter
Funder
Slovak National Research Grant Agency
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference24 articles.
1. International technology roadmap for semiconductors (ITRS), 2013 edition, Test and test equipment, https://goo.gl/Hhiozt, Available online. Last accessed: December 10th, 2017.
2. A fast built-in redundancy analysis for memories with optimal repair rate using a line-based search tree;Jeong;Trans. VLSI Syst. IEEE,2009
3. An advanced bira for memories with an optimal repair rate and fast analysis speed by using a branch analyzer;Jeong;Trans. Comput. Aided Des. Integr. Circuits Syst. IEEE,2010
4. A contribution towards architectures and algorithms for self repair of RAMs;Krištofík;Inf. Sci. Technol. Bull. ACM Slovakia,2015
5. A 3 dimensional built-in self-repair scheme for yield improvement of 3 dimensional memories;Kang;Trans. Reliab. IEEE,2015
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