1. IRDS—International Roadmap for Devices and Systems, Rebooting Computing;Hoefflinger,2020
2. Adaptive methods for machine learning-based testing of integrated circuits and boards[C]//2021 IEEE international test conference (ITC);Liu;IEEE,2021
3. Automated socket anomaly detection through deep learning[C]//2020 IEEE international test conference (ITC);Agrawal;IEEE,2020
4. Equipment failure rate updating—Bayesian estimation;Shafaghi;J. Hazard Mater.,2008
5. Die-level Adaptive Test: Real-Time Test Reordering and elimination[C]//2011 IEEE International Test Conference;Gotkhindikar,2011