Author:
Xu Hui,Zhou Jing,Ma Ruijun,Liang Huaguo,Huang Zhengfeng,Liu Chaoming
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference22 articles.
1. A novel soft error hardened latch design in 90nm CMOS;Shirinzadeh,2012
2. Design of multiple node upset tolerant latch in 32 nm CMOS technology;Huang;Comput.-Aided Design Comput. Graphics,2021
3. Single event transients in digital CMOS—a review;Cavrois;IEEE Trans. Nucl. Sci.,2013
4. Soft errors induced by high-energy electrons;Gadlage;IEEE Trans. Device Mater. Reliab.,2017
5. The Research of New Anti-SEU Memory Read-Write Structure and ECC Encoding Method;Shi,2009
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