A parameterized graph-based framework for high-level test synthesis

Author:

Safari Saeed,Jahangir Amir Hossein,Esmaeilzadeh Hadi

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference32 articles.

1. M.C. McFarland, A.C. Parker, R. Camposano, Tutorial on high-level synthesis, in: Proceedings of the 25th Design Automation Conference, California, June 1988, pp. 330–336.

2. The high-level synthesis of digital systems;McFarland;Proc. IEEE,1990

3. S. Tosun, O. Ozturk, N. Mansouri, E. Arvas, M. Kandemir, Y. Xie, W.-L. Hung, An ILP formulation for reliability oriented high-level synthesis, in: Proceedings of the Sixth International Symposium on Quality Electronic Design (ISQED), March 2005, pp. 364–369.

4. Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits;Michael,2000

5. S. Dey, A. Raghunatan, R.K. Roy, Considering testability during high-level design, ASP DAC, 1998, pp. 205–210.

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3