1. A scalable test strategy for network-on-chip routers;Amory;Proc. IEEE Int. Test Conf.,2005
2. Test cost reduction for the AMD Athlon processor using test partitioning;Sehgal;Proc. IEEE Int. Test Conf.,2007
3. Modular SOC testing with reduced wrapper count;Xu;IEEE Trans. Comput.-Aided Des.,2005
4. S. Benner, O. Martinez, Need for change in test, CAST Workshop, March 2011.
5. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std 1500;Silva,2006