Statistical timing and power analysis of VLSI considering non-linear dependence
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference37 articles.
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2. J. Jess, K. Kalafala, S. Naidu, R. Otten, C. Visweswariah, Statistical timing for parametric yield prediction of digital integrated circuits, in: DAC 03, June 2003.
3. M. Orshansky, A. Bandyopadhyay, Fast statistical timing analysis handling arbitrary delay correlations, in: DAC 04, June 2004.
4. S. Bhardwaj, P. Ghanta, S. Vrudhula, A framework for statistical timing analysis using non-linear delay and slew models, in: ICCAD, November 2006.
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