On the identification of modular test requirements for low cost hierarchical test path construction-Reference-Cited by-同舟云学术

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On the identification of modular test requirements for low cost hierarchical test path construction

Published:2007-04 Issue:3 Volume:40 Page:315-325
ISSN:0167-9260
Container-title:Integration
language:en
Short-container-title:Integration

Author:

Makris Yiorgos,Orailoglu Alex

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Reference23 articles.

1. Hierarchical test generation using precomputed tests for modules;Murray;IEEE Trans. Comput. Aided Des.,1990

2. CHEETA: Composition of hierarchical sequential tests using ATKET;Vishakantaiah,1993

3. Hierarchical test generation under architectural level functional constraints;Lee;IEEE Trans. Computer-Aided Des. Integrated Circuits Syst.,1997

4. Test generation for gigahertz processors using an automatic functional constraint extractor;Tupuri,1999

5. TRANSPARENT: A system for RTL testability analysis, DFT guidance and hierarchical test generation;Makris,1999

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