Impact of intrinsic point defect concentration on thermal transport in titanium dioxide-Reference-Cited by-同舟云学术

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Impact of intrinsic point defect concentration on thermal transport in titanium dioxide

Published:2017-04 Issue: Volume:127 Page:491-497
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Donovan Brian F.,Long Daniel M.,Moballegh Ali,Creange Nicole,Dickey Elizabeth C.^ORCID,Hopkins Patrick E.

Funder

Air Force Office of Scientific Research

North Carolina State University

National Science Foundation

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference48 articles.

1. Dielectric breakdown mechanisms in gate oxides;Lombardo;J. Appl. Phys.,2005

2. S. Blonkowski, Filamentary model of dielectric breakdown, J. Appl. Phys. 107(8). 10.1063/1.3386517.

3. The breakdown of dielectrics under high voltage, with particular reference to thermal instability;Whitehead;Proc. Phys. Soc.,1935

4. Theory of dielectric breakdown in solids;O'Dwyer;J. Electrochem. Soc.,1969

5. Dc electrical degradation of perovskite-type titanates: I, ceramics;Waser;J. Am. Ceram. Soc.,1990

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