On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study-Reference-Cited by-同舟云学术

On the origin of threading dislocations during epitaxial growth of III-Sb on Si(001): A comprehensive transmission electron tomography and microscopy study

Published:2018-01 Issue: Volume:143 Page:121-129
ISSN:1359-6454
Container-title:Acta Materialia
language:en
Short-container-title:Acta Materialia

Author:

Niehle Michael^ORCID,Rodriguez Jean-Baptiste,Cerutti Laurent,Tournié Eric,Trampert Achim

Funder

European Union

State of Berlin

EquipEx EXTRA

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

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