Application of the O-lattice theory for the reconstruction of the high-angle near 90° tilt Si(110)/(001) boundary created by wafer bonding
Author:
Publisher
Elsevier BV
Subject
Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials
Reference24 articles.
1. Structure of the GaAs/InP interface obtained by direct wafer bonding optimised for surface emitting optical devices
2. Dislocations as Active Components in Novel Silicon Devices
3. Amorphization/templated recrystallization method for changing the orientation of single-crystal silicon: An alternative approach to hybrid orientation substrates
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3. Incommensurate grain boundary in silicon and the silver-ratio sequence;Physical Review B;2019-09-05
4. Tilt boundaries and associated solute segregation in a Mg–Gd alloy;Acta Materialia;2017-04
5. Secondary dislocation structures in a Ni–TiN system from the GMS and O-lattice theory;Physica E: Low-dimensional Systems and Nanostructures;2016-03
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