On the proper selection of reflections for the measurement of bulk residual stresses by diffraction methods

Author:

Clausen B.,Leffers T.,Lorentzen T.

Publisher

Elsevier BV

Subject

Metals and Alloys,Polymers and Plastics,Ceramics and Composites,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. Macherauch E, Kloos KH. In: Macherauch E, Hauk, V, editors. Residual stresses in science and technology. Oberursel: DGM Informationsgesellschaft; 1987, p. 3.

2. MacEwen SR, Christodoulou N, Tomé CN, Jackman J, Holden TM, Faber Jr J, Hitterman RL. In: Kallend JS, Gottstein G, editors. Proceedings of ICOTOM 8. Warrendale: The Metallurgical Society; 1988, p. 825.

3. Tomé CN, Christodoulou N, Holt R, Woo CH, Lebensohn RA, Turner PA. In: Andersen SI, et al., editors. Numerical Predictions of Deformation Processes and the Behaviour of Real Materials. Roskilde: Risø National Laboratory; 1994, p. 169.

4. Turner PA, Tomé CA. Acta Metal Mater 1994;42:4143.

5. Clausen B, Lorentzen T, Leffers T. Acta mater 1998;46:3087.

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